Slide scanners have become increasingly popular among researchers thanks to their compact design and broad application range. When working with thick specimens, a powerful solution is Speckle Illumination Acquisition (VS-SILA). Integrated with the SLIDEVIEW™ VS200 research slide scanner, VS-SILA enables fast optical sectioning to produce sharp, high-contrast images from samples up to 300 µm thick.

The new six-line laser combiner expands flexibility by allowing you to select wavelengths freely—from UV to NIR—to suit your specific application needs. Experience the full spectral range using laser lines at 395 nm, 488 nm, 532 nm, 594 nm, 638 nm, and 730 nm, now available for the VS200 speckle-illumination optical sectioning module.

Join us to explore how VS-SILA enhances whole-slide imaging quality and enables confocal-like performance for thick samples across the entire spectrum!

Learning Outcomes

• Apply AI‑Assisted Scanning for smarter, automated image acquisition

• Generate confocal‑like whole‑slide images from thick specimens using VS200 with SILA

• Understand the end‑to‑end workflow of Automated Digital Slide Management

Convenor Tong Wu, Evident Australia Pty Ltd

Instruments/Software VS200 and VS200 SILA. VS200 ASW and VS200 desktop with TruAI™ deep learning technology.

Duration 2 hr 10 min, several sessions available

Experience Level Suits all levels

Pricing $25.00

Samples Samples will be provided

Please register for workshops by selecting them as optional add-ons via the LMA2026 registration StickyTickets website linked below.